Blog

Benvenuti nella nostro nuovo Comunità Blog di Instron. Si tratta di una raccolta di contruibuti redatti dalle nostre menti più talentuose in Instron. Il mondo della scienza dei materiali è così vasto ed include diverse industrie e materiali: tutte sfide che richiedono conoscenze ed esperienze specifiche, che una sola persona non può assolutamente gestire e possedere. Ci vuole un piccolo esercito dietro le quinte che collabora e condivide il proprio know-how tecnico, le esperienze, le idee più pertinenti e che tempestive informa tutti voi: i nostri lettori.

Vi invitiamo a raccontarci di voi, condividere le vostre storie e parlare delle vostre esperienze. Entra nella Communità Blog di Instron.

How Quick is a "QuickTest"?

As a standard feature with the new Bluehill® Universal Software, QuickTest allows operators to start testing after merely entering basic parameters in a few seconds.

Posted On Jun 08, 2017 01:26 PM

When You Don’t Take Advantage of Software Updates

As anyone with a smartphone is aware, software developers are constantly improving their software with periodic updates for a variety of reasons. Major phone companies release updates at least once a year, and in between the major updates, they push out smaller bug fixes and patches as flaws are inevitably found in the program, application, or operating system. This same idea applies with Bluehill® Software.

Posted On May 24, 2017 10:32 AM

What Does "Touch-friendly" Software Actually Mean?

The progressive outcome of Bluehill® Universal took a consolidated effort from Instron experts, bringing together unrivaled experience and cutting-edge research. The user experience has been designed by a collaboration of members from different software teams across the world, each team representing various software products offered by Instron. This consortium has worked closely together to create a Bluehill application style that can be translated across all of Instron’s software products.

Posted On Apr 13, 2017 04:18 PM

Micro Three-Point Bend Testing for Microelectronics

Reliability analysis of electronic packages and components is a critical step in microelectronics, as these packages are widely used in portable devices such as smartphones, tablets, laptops, etc. Studying electrical performance may not be enough, as a package’s mechanical characterization can directly or indirectly impact reliability of a finished product. Three-point bend tests are performed to understand the strength of chip packages, such as chip-on-film (COF), integrated circuits (IC), and ball grid arrays (BGAs).

Posted By On Apr 03, 2017 03:33 PM

Own Your Data and Results: Export Files, Import to LIMS

Accurate and repeatable test results are the most important product of a mechanical test. Properly managing these test results can be more challenging than conducting the test itself. Although there are several common data management and results reporting practices throughout the testing industry, most labs take approaches that are unique to them. In order to make it easier for all labs to take control of their test results and data, we have introduced several new exporting features with the release of Bluehill® Universal.

Posted By Jeffrey Shaffer On Mar 30, 2017 01:36 PM

How Important is Calibrating Materials Testing Systems?

There are many different reasons why you should calibrate your testing system. Primarily, calibration is performed to ensure that your testing system is operating within its requirements. Whether these requirements are established by law, government regulation, industry regulation, or your own company quality system, organizations have recognized the importance of calibrating systems at regular intervals.

Posted On Mar 23, 2017 09:04 AM

Traceability: What is it, and Why is it Important?

Let’s begin with a definition from The International Vocabulary of Metrology (VIM): Metrological Traceability is the property of a measurement result whereby the result can be related to a reference through a documented unbroken chain of calibrations, each contributing to the measurement uncertainty.

Posted On Feb 12, 2017 04:14 PM

Growth of ITW Young Professionals Network in Europe

Instron Applications Engineers Maeve Higham and Alessandro Zazzarelli sat down for an interview to share their great work for Europe’s Young Professionals Network. This newly established cohort is gathering across Europe and supporting the rising talent of Illinois Tool Works (ITW), Instron’s parent company.

Posted On Dec 08, 2016 10:14 AM